Towards the Fabrication and Measurement of High Sensitivity SiC-UV Detectors with Oxide Ramp Termination

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Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

1495-1498

DOI:

10.4028/www.scientific.net/MSF.457-460.1495

Citation:

G. Brezeanu et al., "Towards the Fabrication and Measurement of High Sensitivity SiC-UV Detectors with Oxide Ramp Termination ", Materials Science Forum, Vols. 457-460, pp. 1495-1498, 2004

Online since:

June 2004

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$35.00

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