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HomeMaterials Science ForumMaterials Science Forum Vols. 457-460Towards the Fabrication and Measurement of High...

Towards the Fabrication and Measurement of High Sensitivity SiC-UV Detectors with Oxide Ramp Termination

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Silicon Carbide and Related Materials 2003

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Periodical:

Materials Science Forum (Volumes 457-460)

Pages:

1495-1498

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.457-460.1495

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Online since:

June 2004

Authors:

Gheorghe Brezeanu, Philippe Godignon, E. Dimitrova, Christophe Raynaud, Dominique Planson, Andrej Mihaila, F. Udrea, José Millan, G. Amaratunga, C. Boianceanu

Keywords:

Medici Simulation, OBIC Measurements, Oxide Ramp Termination, UV Detector

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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