EPR and Pulsed ENDOR Study of El6 and Related Defects in 4H-SiC

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 457-460)

Edited by:

Roland Madar, Jean Camassel and Elisabeth Blanquet

Pages:

465-468

Citation:

T. Umeda et al., "EPR and Pulsed ENDOR Study of El6 and Related Defects in 4H-SiC", Materials Science Forum, Vols. 457-460, pp. 465-468, 2004

Online since:

June 2004

Export:

Price:

$38.00