Surface and Interface Studies of Si-Rich 4H-SiC and SiO2

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Materials Science Forum (Volumes 483-485)

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581-584

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May 2005

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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[1] C. Virojanadara and L. I. Johansson, Surf. Sci. 505, 358 (2002).

Google Scholar

[2] F. Amy, H. Enriquez, P. Soukiassian, P. - F. Storino, Y. J. Chabal, A. J. Mayne, G. Dujardin, Y. K. Hwu, and C. Brylinski, Phys. Rev. Lett. 86, 4342 (2001).

DOI: 10.1103/physrevlett.86.4342

Google Scholar

[3] F. Amy, P. Soukiassian, Y. -K Hwu and C. Brylinski, Phys. Rev. B 65, 165323 (2002).

Google Scholar

[4] Y. Hoshino, T. Nishimura, T. Yoneda, K. Ogawa, H. Namba, Y. Kido, Surf. Sci. 505, 234 (2002).

Google Scholar

[5] Y. Hoshino, S. Matsumoto, Y. Kido, Surf. Sci. 531, 295 (2003).

Google Scholar

[6] C. Virojanadara and L. I. Johansson, Phys. Rev. B. 68, 125314 (2003).

Google Scholar

[7] K. Reuter, J. Bernhardt, H. Wedler, J. Schardt, U. Starke, and K. Heinz, Phys. Rev. Lett. 79, 4818 (1997).

DOI: 10.1103/physrevlett.79.4818

Google Scholar

[8] U. Starke, J. Schardt, J. Bernhardt, M. Franke, K. Reuter, H. Wedler, and K. Heinz, Phys. Rev. Lett. 80, 758 (1998).

Google Scholar