Materials Science Forum
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Paper Title Page
Abstract: Adobe is commonly found in Aveiro's ancient constructions. Preservation and
rehabilitation of those constructions, some of them with architectural and historical interest, has
been forgotten for many years. As a result, in Aveiro region, the majority of existing constructions
in adobe is structurally weak, and, in several cases, they are in the threshold of ruin. Rehabilitation
and/or strengthening urge.
Despite some efforts has been made, a great difficulty for technicians working on the rehabilitation
of these constructions relies on the lack of knowledge on adobe's mechanical behaviour. In fact, in
order to properly describe the structural behaviour of those constructions, there is a need to
investigate the mechanical behaviour of adobe. Hence, this paper is based on a study intended to
characterise the behaviour of adobe brick units. Specimens were prepared from selected
representative constructions of the Aveiro region. The prepared specimens were tested in order to
evaluate their mechanical behaviour in compression and tension.
1571
Abstract: The purpose of the present paper was to investigate the effect of interlayer on the
maximum contact stresses in the critical regions in a hard coating under static contact condition
using finite element analysis. Four different elastic moduli and nine different thickness of interlayer
were used. Modeling results showed that the interlayer did not reduce the maximum shear stress at
the coating/substrate interface, whether it was thick or thin. When the thin interlayer was presented,
whether it was soft or hard, the maximum tensile stress on surface and maximum von Mises stress
within coating were decreased.
1576
Abstract: In this work, the structural evolution and damage of PET during stretching is assessed by
wide- and small-angle X-ray scattering (respectively, WAXS and SAXS) experiments in specimens
pre-deformed at different strain levels (ex-situ characterization). Injection moulded PET rectangular
tensile specimens were stretched (at 2 mm/min) into the plastic domain in a universal test machine
at different strain levels at room temperature. The structure of the central zone of the deformed
specimens was then characterized by WAXS and SAXS experiments using an X-ray synchrotron
source. PET was initially (before stretching) amorphous. A strong molecular orientation in the
stretching direction is quickly developed for the initial plastic deformation levels, evidenced by
strong equatorial WAXS reflections. This orientation rapidly levels off, remaining constant during
further stretching. The WAXS patterns are accompanied with no reflections on SAXS, evidencing a
local ordering phenomenon, typical of nematic liquid-crystalline structures. The SAXS patterns
evidence the occurrence of some voiding in the cold drawing regime just after yielding. These
anisotropic voids are oriented perpendicular to the stretching direction, as in a craze-like structure.
The void size drastically increases at the onset of the strong strain hardening behaviour.
1583
Abstract: A sputter deposition chamber inserted into the six-circle Huber diffractometer of the
materials research station of the ROssendorf BeamLine (ROBL-CRG) at ESRF allowed to perform
in-situ experiments during film growth of Ni-Ti. It is equipped with Kapton windows for X-Ray
Diffraction (XRD) and specular Reflectivity (XRR) measurements. By following in situ the
evolution of the structure of the growing film, we reveal intermediate “states” which cannot be
seen/revealed ex situ, because those states occurred only during the growth but were no longer
visible after deposition. Vertical Bragg-Brentano large-angle scattering geometry was employed to
study the different trends of structural transformations taking place during deposition. Ni-Ti films
exhibiting a non-uniform phase content across the film thickness could be produced by varying the
power of co-sputtering Ni-Ti plus Ti. A significant decrease of IB2{110}/IB2{200} was observed when a
bias of -45 V was applied.
1588
Abstract: When atomic force microscopy is used to retrieve nanomechanical surface properties of
materials, unsuspected measurement and instrumentation errors may occur. In this work, some error
sources are investigated and operating and correction procedures are proposed in order to maximize
the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co
samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as
well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular
the creep of the z-piezo, and errors in the determination of the real dimensions of tested areas, are
critical parameters to be considered. However, it was observed that there is a critical load
application rate, above which the influence of the creep of the z-piezo can be neglected. Also, it was
observed that deconvolution of the tip geometry from the image of the tested area is essential to
obtain accurate values of the dimensions of indentations and scratches. The application of these
procedures enables minimizing the errors in nanomechanical property measurements using atomic
force microscopy techniques.
1598
Abstract: Quaternary GaInAsSb films alloys were grown by MOVPE technique on GaSb
substrates with different growth conditions such as substrate orientation and thickness. The
composition of the films determines their bandgap, and also how well they are lattice matched
to the substrate. It is thus essential to determine it accurately, which is not a trivial task in this
system. The composition of the samples was studied with a combination of Particle Induced Xray
Emission (PIXE) and Rutherford Backscattering Spectrometry (RBS) experiments. The
RBS experiments were done with a 2 MeV 4He+ or H+ ion beam, according to the thickness of
the films, and were used to determine the thickness of the samples. The PIXE experiments were
performed at grazing angle conditions and provided accurate elemental composition
information. It was found that for thin layers (300 nm) there is a dependence of In incorporation
into the matrix according to the substrate orientation, although this tendency was not found for
thicker films (24m).
1603
Abstract: Induced defects in silver polycrystalline samples irradiated with 4 keV Ar+ were
characterised with slow positron implantation spectroscopy. The implanted gas was found to
interact with ion irradiation defects. The evolution of the defects and gas-defect interactions were
followed through a multi-step isochronal annealing treatment. Two different defected regions were
detected. A region near to the surface, due to a distribution of vacancy-like defects produced by
irradiation, and a deeper one due to coalescence of Ar. The deeper defects evolve with thermal
treatments and probably produce cavities which are not easily recovered.
1608
Abstract: The thin and textured coatings present a double difficulty for characterization by
conventional X-ray diffraction. Their shallow depth reduces the diffracted intensity and allows the
interference of the underlying material. Frequently they present a crystallographic texture which
limits the number of orientations that provide good intensity and induces anisotropy effects on their
mechanical behavior. Reliable results can be determined using diffraction geometry of lowincidence
angle. This paper describes the application of the technique to several films, characterized
by thicknesses of the order of 1 μm and crystallographic textures. Examples are proposed of
chromium films applied by PVD on molybdenum substrates, decorative electroplated coatings, and
aluminum coatings used for interconnections in microelectronic circuits. The Cr films are 1.5 μm
thick and exhibit a strong <100> fiber texture. The decorative coatings were studied both on the
nickel undercoat and in the Cr top layer. Results are presented for chromium where tensile stresses
and a <110> fiber texture were observed. The Al films are 1.0 μm thick. Some samples were heattreated
at different annealing temperatures. Tensile stresses were always observed, which increase in
the annealed samples.
1613
Abstract: The conventional Bragg diffraction geometry, normally used to characterize the residual
surface stress state, it is not suitable to evaluate surface treated materials and thin films. The X-ray
path lengths through a surface layer or thin film are too short to produce adequate diffraction
intensities in relation to the bulk or the substrate. Another limitation of the conventional technique
appears when a residual stress gradient is present in the irradiated surface. The technique only
enables the evaluation of the mean value of this gradient. In these cases, a recently proposed
Pseudo-Grazing Incident X-ray Diffraction method would be better applicable.
In this study, the Pseudo-Grazing Incidence X-ray Diffraction is applied to characterize the residual
stress depth profiles of several AISI 4140 samples, which were prepared, by mechanical polishing
and grinding, in order to present different surface roughness parameters, Ra. The experimental
results lead to the conclusion that the surface roughness limits the application of the
Pseudo-Grazing Incidence methodology to a minimum X-ray incident angle. This angle is the one
that enables a mean X-ray penetration depth with the same order of magnitude of the sample surface
roughness parameter, Ra.
1618