Fabrication of 4H-SiC Floating Junction Schottky Barrier Diodes (Super-SBDs) and their Electrical Properties

Article Preview

Abstract:

4H-SiC floating junction Schottky barrier diodes (Super-SBDs) were fabricated. It was found that their properties are closest to the theoretical limitation, defined by the relationship between specific on-state resistance and breakdown voltage of 4H SiC-unipolar devices. They have a p-type floating layer designed as line-and-spacing. The specific on-state resistances of Super-SBDs with a few micrometers of spacing width were found to be nearly equal to those of conventional SBDs without p-type floating layer. The breakdown voltages of Super-SBDs were higher than those of conventional SBDs. Accordingly the properties of Super-SBDs have improved the trade-off between specific on-state resistance and breakdown voltage, and the highest value to date for Baliga’s Figure of Merit (BFOM) has been obtained.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volumes 527-529)

Pages:

1175-1178

Citation:

Online since:

October 2006

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2006 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] I. Ohmura, et al.: US Patent. 6, 037, 632 (2000).

Google Scholar

[2] W. Saitoh, et al.: IEEE Intern. Symp. Power Semicond. Devices and ICs (ISPSD) (2002), p.33.

Google Scholar

[3] K. Adachi, et al.: Mat. Sci. For. 433-436 (2003), p.887.

Google Scholar

[4] T. Hatakeyama, et al.: Mat. Sci. For. 483-485 (2005), p.921.

Google Scholar

[5] J. Nishio, et al.: Mat. Sci. For. 483-485 (2005), p.147.

Google Scholar

[6] B. J. Baliga: IEEE Electron Device Lett. 10 (1989), p.455.

Google Scholar

[7] Konstantinov, et al.: J. Electron. Mat. 27 (1998), p.335.

Google Scholar

[8] A. Itoh, et al.: Proc. of ISPSD'95 (1995), p.101.

Google Scholar

[9] H. Mitlehner, et al.: Proc. of ISPSD'97 (1997), p.165.

Google Scholar

[10] A. Itoh, et al.: Inst, Phys. Conf. Ser. 142 (1995) Chapter 4, p.689.

Google Scholar

[11] F. Dahlquist, et al.: Mat. Sci. For. 338-342 (2000), p.1179.

Google Scholar

[12] T. Kimoto, et al.: Jpn. J. Appl. Phys. 42 (2003), p. L13.

Google Scholar

[13] Y. Sugawara, et al.: Mat. Sci. For. 338-342 (2000), p.1183.

Google Scholar

[14] T. Nakamura, et al.: IEEE Electron Devices Letters, 26, No. 2 (2005), p.99 Ron [mOhm cm2 ] 100 1000 10000 100 10 1 0. 1 Vbd [V] A A D B C Toshiba A: Kyoto Univ. B: Kansai EP C: ABB D: Infineon E: CREEPI * this study A E Ref.

Google Scholar

[7] Table 1 BFOM values of SBDs reported so far. Fig. 7. Trade-off relationship between breakdown voltages and specific on-state resistances of SBDs. Organization BFOM.

Google Scholar

[8] Siemens 1920 '97.

Google Scholar

[9] Kyoto Univ. 2450 '95.

Google Scholar

[10] ABB, KTH 3333 '00.

Google Scholar

[11] Kyoto Univ. 1529 '03.

Google Scholar

[12] Kansai EP 1206 '99.

Google Scholar

[13] CREEPI 7595 '05.

Google Scholar

[14] This study 7762 '05.

Google Scholar