The Role of Residual Source/Drain Implant Damage Traps on SiC MESFET Drain I-V Characteristics

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Periodical:

Materials Science Forum (Volumes 527-529)

Edited by:

Robert P. Devaty, David J. Larkin and Stephen E. Saddow

Pages:

1247-1250

Citation:

J. Adjaye et al., "The Role of Residual Source/Drain Implant Damage Traps on SiC MESFET Drain I-V Characteristics", Materials Science Forum, Vols. 527-529, pp. 1247-1250, 2006

Online since:

October 2006

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