6H-SiC Crystals Grown in [015] and [001] Directions Characterized by High Energy Triple-Axis X-Ray Diffraction

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Periodical:

Materials Science Forum (Volumes 556-557)

Edited by:

N. Wright, C.M. Johnson, K. Vassilevski, I. Nikitina and A. Horsfall

Pages:

219-222

DOI:

10.4028/www.scientific.net/MSF.556-557.219

Citation:

M. Stockmeier et al., "6H-SiC Crystals Grown in [015] and [001] Directions Characterized by High Energy Triple-Axis X-Ray Diffraction", Materials Science Forum, Vols. 556-557, pp. 219-222, 2007

Online since:

September 2007

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