Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation

Abstract:

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6H-SiC n+p diodes fabricated on a p-type epitaxial layer were irradiated with 1MeV-electrons at fluences up to 6×1016 cm-2 to clarify their radiation tolerance. Charge Collection Efficiencies (CCEs) were evaluated from the Transient Ion Beam Induced Current (TIBIC) using Oxygen (O) ions. The CCE of 93 % was obtained for non-electron-irradiated diodes, and no significant change in CCE was observed for diodes irradiated with electrons at fluences below 1×1015 cm-2. The degradation of CCE was observed after irradiation at fluences above 5×1015 cm-2.

Info:

Periodical:

Materials Science Forum (Volumes 600-603)

Edited by:

Akira Suzuki, Hajime Okumura, Tsunenobu Kimoto, Takashi Fuyuki, Kenji Fukuda and Shin-ichi Nishizawa

Pages:

1043-1046

DOI:

10.4028/www.scientific.net/MSF.600-603.1043

Citation:

N. Iwamoto et al., "Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation", Materials Science Forum, Vols. 600-603, pp. 1043-1046, 2009

Online since:

September 2008

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$35.00

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