[1]
A. A. Ned, A.D. Kurtz and F. Masheeb, "High Temperature 6H-SiC Pressure Sensors with Improved Performance," International High Temperature Conference, Cleveland, OH, May 1999.
Google Scholar
[2]
B. Keyes, J. Brogan, C. Gouldstone, R. Greenlaw, J. Yang, J. Fraley, B. Western, M. Schupbach, "High Temperature Telemetry Systems for in Situ Monitoring of Gas Turbine Engine Components," Aerospace conference, 2009 IEEE , pp.1-15, Mar (2009)
DOI: 10.1109/aero.2009.4839523
Google Scholar
[3]
B. Khorsandi, W. Windl, T.E. Blue, W. Luo, J. Kulisek, M. Reisi-Fard, and V. Krishnan, "4H-SiC Based Neutron Flux Monitors in Very High Temperature Nuclear Reactors," MS&T 2006, Cincinnati, OH.
DOI: 10.1557/proc-0929-ii03-04
Google Scholar
[4]
M. E. Levinshtein, S. L. Rumyantsev, and M. S. Shur, Properties of Advanced Semiconductor Materials: GaN, AIN, InN, BN, SiC, SiGe, 1st ed., Wiley-Interscience, Feb 2001.
Google Scholar
[5]
J. Yang, J. Fraley, B. Western, M. Schupbach, A.B. Lostetter, "Characterization of SiC JFETs and its Application in Extreme Temperature (over 450ºC) Circuit Design", Material Science Forum, Vol 647 (2010), pp.949-953, 2010.
DOI: 10.4028/www.scientific.net/msf.645-648.949
Google Scholar
[6]
A. S. Sedra and K. C. Smith, Micro-Electronic Circuits, HRW 1982.
Google Scholar
[7]
X. A. Fu, A. Patil, T. H. Lee, S. Garverick, and M. Mehregany, "Fabrication of SiC JFET-Based Monolithic Integrated Circuits", Material Science Forum, Vol 648, pp.1115-1119, 2010.
DOI: 10.4028/www.scientific.net/msf.645-648.1115
Google Scholar
[8]
I. Sinclair and J. Dunton, Practical Electronics Handbook, 6th Ed., Newnes, Jan 2007.
Google Scholar