Change of the Characterization Techniques as Progress of CuInSe2-Based Thin-Film PV Technology

Katsumi Kushiya; Hiroki Sugimoto; Yoshiyuki Chiba; Yoshiaki Tanaka; Hideki Hakuma

doi:10.4028/www.scientific.net/MSF.725.165

Paper Titles

High-Speed Deep-Level Luminescence Imaging in Multicrystalline Si Solar Cells
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Combinatorial Synthesis Study of Passivation Layers for Solar Cell Applications
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Change of the Characterization Techniques as Progress of CuInSe₂-Based Thin-Film PV Technology
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Reduction of Crack Formation in Transcription of Cu(In,Ga)Se₂ Thin Film Solar Cell Structure
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Evaluation of Organic Thin Film Solar Cells Using 3-Diode Equivalent Circuit Model with Inverted Diode
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HomeMaterials Science ForumMaterials Science Forum Vol. 725Change of the Characterization Techniques as...

Change of the Characterization Techniques as Progress of CuInSe₂-Based Thin-Film PV Technology

Abstract:

In the CuInSe₂(CIS)-based thin-film PV technology, various characterization techniques have been applied to measure the composition, crystal structure, depth profile and defect chemistry and so on, since Boeing Aerospace, for the first time, has come to the 10 % milestone in a thin-film form in 1980 by fabricating a very small single cell with top grids. More advanced and comprehensive characterization techniques are being applied after over 18 % total-area efficiency was consistently achieved employing the “three stage method”, which was developed by National Renewable Energy Laboratory (NREL). Comparing to the CIS-based absorber, there are not so many researches to investigate the absorber/buffer interface because the buffer is too thin to analyse separately and precisely and there are quite limited information on reaction pathways and composition of the buffer layer. However, in order to achieve the aperture-area efficiency of over 18 % on over 800cm²-sized large-area integrated circuits, it is remarkably important how to enhance the quality of absorber/buffer interface. Therefore, analytical works to understand how to improve the FF should tend to be more and more important.

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Materials Science Forum (Volume 725)

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165-170

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https://doi.org/10.4028/www.scientific.net/MSF.725.165

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July 2012

Authors:

Katsumi Kushiya, Hiroki Sugimoto, Yoshiyuki Chiba, Yoshiaki Tanaka, Hideki Hakuma

Keywords:

Characterization Techniques, CuInSe₂-Based Thin-Film PV Technology, Photovoltaic (PV) Technology, Thin-Film Solar Cells

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