Simulations of SiC CVD - Perspectives on the Need for Surface Reaction Model Improvements

Article Preview

Abstract:

Simulations of SiC chemical vapor deposition is an excellent tool for understanding, improving and optimizing this complex process. However, models used up to date have often been validated for one particular set of process parameters, often in the silicon limited growth regime, in one particular growth equipment. With chlorinated precursors optimal growth condition is often found to take place at the border between carbon limited and silicon limited regimes. At those conditions the previous models fail to predict deposition rates properly. In this study we argue that molecules like C2H2, C2H4 and CH4, actually might react with the surface with much higher rates than suggested before. Comparisons are made between the previous model and our new model, as well as experiments. It is shown that higher reactivities of the hydrocarbon molecules will improve simulation results as compared to experimental findings, and help to better explain some of the trends for varying C/Si ratios.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volumes 778-780)

Pages:

218-221

Citation:

Online since:

February 2014

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Ö. Danielsson, A. Henry, and E. Janzén, J. Cryst. Growth 243 (2002) 170.

Google Scholar

[2] S. -i. Nishizawa and M. Pons, Chem. Vap. Deposition 12 (2006) 516.

Google Scholar

[3] A. Veneroni and M. Masi, Chem. Vap. Deposition 12 (2006) 562.

Google Scholar

[4] Ö. Danielsson, P. Sukkaew, M. Yazdanfar, O. Kordina and E. Janzén, Mat. Sci. Forum 740742 (2013) 213.

Google Scholar

[5] Ö. Danielsson, P. Sukkaew, L. Ojamäe, O. Kordina and E. Janzén, Theor. Chem. Acc. 132 (2013) 1398, DOI: 10. 1007/s00214-013-1398-9.

DOI: 10.1007/s00214-013-1398-9

Google Scholar

[6] M. D. Allendorf and R. J. Kee, J. Electrochem. Soc. 138 (1991) 841.

Google Scholar

[7] P. M. Löfgren, W. Ji, C. Hallin, and C. -Y. Gu, J. Electrochem. Soc. 147 (2000) 164.

Google Scholar

[8] H. Pedersen, S. Leone, A. Henry, F. C. Beyer, V. Darakchieva and E. Janzén, J. Cryst. Growth 207 (2007) 334.

Google Scholar

[9] M. Yazdanfar, H. Pedersen, O. Kordina and E. Janzén, ICSCRM 2013, Miyazaki, Japan.

Google Scholar

[10] C. D. Stinespring and J. C. Wormhoudt, J. Appl. Phys. 65 (1989) 1733.

Google Scholar

[11] C. J. Mogab and H. J. Leamy, J. Appl. Phys. 45 (1974) 1075.

Google Scholar