[1]
H. Habuka, Y. Fukumoto, K. Mizuno, Y. Ishida and T. Ohno, Cleaning process applicable to silicon carbide chemical vapor deposition reactor, ECS J. Solid State Sci. Technol., 3 (2014) N3006-N3009.
DOI: 10.1149/2.002401jss
Google Scholar
[2]
K. Mizuno, H. Habuka, Y. Ishida and T. Ohno, In situ cleaning process of silicon carbide epitaxial reactor, ECS J. Solid State Sci. Technol., 4 (2015) P137-P140.
DOI: 10.1149/2.0091505jss
Google Scholar
[3]
K. Mizuno, K. Shioda, H. Habuka, Y. Ishida and T. Ohno, Repetition of in situ cleaning using chlorine trifluoride gas for silicon carbide epitaxial reactor, ECS J. Solid State Sci. Technol., 5 (2016) P12-P15.
DOI: 10.1149/2.0051602jss
Google Scholar
[4]
H. Matsuda, H. Habuka, Y. Ishida and T. Ohno, Metal fluorides produced using chlorine trifluoride gas, J. Surf. Eng. Mater. Adv. Technol., 5 (2015) 228-236.
DOI: 10.4236/jsemat.2015.54024
Google Scholar
[5]
K. Shioda, K. Kurashima, H. Habuka, H. Ito, S. Mitani and Y. Takahashi, Quick cleaning process for silicon carbide chemical vapor deposition reactor, ECS J. Solid State Sci. Technol., 6 (2017) P526-P530.
DOI: 10.1149/2.0161708jss
Google Scholar
[6]
H. Habuka, K. Tanaka, Y. Katsumi, N. Takechi, K. Fukae, and T. Kato, Temperature-dependent behavior of 4H-silicon carbide surface morphology etched using chlorine trifluoride gas, J. Electrochem. Soc., 156 (2009) H971-H975.
DOI: 10.1149/1.3243878
Google Scholar
[7]
http://www.toyotanso.co.jp/Products/technicalservices/purification.html.
Google Scholar
[8]
A. C. Ferrari and J. Robertson, Interpretation of Raman spectra of disordered and amorphous carbon, Phys. Rev. B 61 (2000) 14095-14107.
DOI: 10.1103/physrevb.61.14095
Google Scholar