Silicon Surface and Interface Damage Studies Using Ion Implantation

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Periodical:

Solid State Phenomena (Volumes 1-2)

Edited by:

D. Stievenard and J.C. Bourgoin

Pages:

187-194

DOI:

10.4028/www.scientific.net/SSP.1-2.187

Citation:

S. Ashok "Silicon Surface and Interface Damage Studies Using Ion Implantation", Solid State Phenomena, Vols. 1-2, pp. 187-194, 1988

Online since:

January 1991

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$35.00

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