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HomeSolid State PhenomenaSolid State Phenomena Vols. 19-20

Solid State Phenomena Vols. 19-20

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.19-20

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Paper Title Page

Diagnostics of Defects from the Noise Spectra

Authors: V.M. Aroutyunyan, F.V. Gasparyan, S.V. Melkonyan

535

Statistical Analysis of the Assembly-Induced Degradation of the Silicon Device Parameters

Authors: F. Gaiseanu

541

Mechanical Strain Relaxation during Lattice-Mismatched Epitaxial Growth

Authors: A. Schlachetzki, H.-H. Wehmann

551

Interfacial Dislocations in the GaSb/GaAs (001) Heterostructure

Authors: A.M. Rocher

563

Si/Ge - Heterostructures - Stability of Strained Layer Superlattices

Authors: Erich Kasper

573

Distribution of Defects in InAs_1-x-ySb_xP_y-InAs DHs

Authors: T.S. Argunova, R.N. Kyutt, B.A. Matveev, S.S. Ruvimov, N.M. Stus', G.N. Talalakin

581

Nature of Defects in MOCVD Grown GaAlAs-GaAs QW DHs

Authors: B.S. Yavich, I.N. Kochnev, P.P. Buinov, N.I. Katzavetz, T.S. Argunova, G.N. Mosina, S.S. Ruvimov

587

XPS Sputter Depth Profiling Applid to the Analysis of Si/SiO₂, Si/SiO_xN_y and Si/Si₃N₄

Authors: O. Benkherourou, J.P. Deville

593

Electrical Stability of Thin Nitroxide Layers on Silicon after RTO/RTN/RTO-Treatment

Authors: G. Weidner, G. Prösch, A. Beyer, M. Wolf, V. Rank, M. Kopp

599

Germanium and Antimony Epitaxy with Large Lattice Misfit

Authors: H.J. Osten, Jeffrey Klatt, G. Lippert

605

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