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HomeSolid State PhenomenaSolid State Phenomena Vols. 19-20

Solid State Phenomena Vols. 19-20

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.19-20

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Paper Title Page

Indirect Excitations in the X-Ray Standing Wave Method

Authors: A.V. Maslov

471

Double-Channel X-Ray Standing Wave Technique for Impurity Atom Location in Multicomponent Crystals

Authors: E. Kh. Mukhamedzhanov

475

Spectroscopical and Electrical Evidences about Segregation Effects in Semiconductors

Authors: Sergio Pizzini, Maurizio Acciarri, Simona Binetti

479

DLTS of High-Resistivity Si

Authors: Eddy Simoen, Cor Claeys, G. Huylebroeck, Paul Clauws

493

Evaluation of DLTS Measurements in the Case of "Broadened" Spectra or a Barrier Limited Capture Process

Authors: K. Tittelbach-Helmrich

499

B-Ion Implantation into Mo-Film for Shallow Junction Formation: DLTS Analyses on the p⁺/n Fabricated Diodes

Authors: Antonella Poggi, R. Angelucci, E. Susi, M. Merli

505

Electrical Evaluation of Silicon on Insulator Structures Formed by Oxygen Implantation by Means of Frequency Resolved Photoconductivity Measurements

Authors: F. Coromina, A. Pérez-Rodríguez, J.R. Morante, M.A. Lourenço, K.P. Homewood, P.L.F. Hemment

511

Nonlinear Recombination and Diffusion Processes in Si and GaAs

Authors: D. Noreika, V. Netiksis, M. Petrauskas, M. Lenzner

517

Carrier Recombination Processes in PbTe Films by Picosecond IR Excitation

Authors: R. Tomasiunas, R. Masteika, K. Tumkevicius, M. Petrauskas

523

Investigation on Electrical Contacts on N-Type Silicon

Authors: Antonio Castaldini, Daniela Cavalcoli, Anna Cavallini

529

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