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HomeSolid State PhenomenaSolid State Phenomena Vols. 19-20

Solid State Phenomena Vols. 19-20

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.19-20

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Table of Contents

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Paper Title Page

Behavior of Implanted Nitrogen in Si with the Buried Layer of SiO₂ Precipitates

Authors: A.B. Danilin, K.A. Drakin, A.A. Malinin, V.N. Mordkovich, A.F. Petrov, O.I. Vyletalina

405

Interaction of Implanted into Silicon Fluorine with Radiation Defects

Authors: L.Ya. Krasnobaev, A.A. Malinin, V.V. Makarov, I.B. Sayapin

411

Electrical Activity of Halogen-Silicon Complexes

Authors: L.Ya. Krasnobaev, N.M. Omelyanovskaya

417

Radiation Defect-Induced Optical Absorption of GaP

Authors: C. Ascheron, H. Neumann, W. Hörig, G. Nooke

423

Synchrotron Radiation X-Ray Topography of Growth Striations in Magnetic-Field-Applied Czochralski Silicon

Authors: S. Kawado, Soichiro Kojima, I. Maekawa, Tetsuya Ishikawa

429

Applications of In Situ Transmission Electron Microscopy to the Characterization of Process-Induced Defects

Authors: Manfred Reiche, J. Heydenreich

439

TEM Techniques for 2D Junction Delineation and Correlation with SIMS and SRP

Authors: A. Romano-Rodríguez, Jan Vanhellemont, A. De Keersgieter, W. Vandervorst, J.R. Morante

449

Defect Generation in Cz-Silicon Used for the Design of Synchrotron Monochromator Crystals

Authors: P. Zaumseil, U. Winter, St. Joksch

455

X-Ray Diffractometry and Topography of CdHgTe Bulk Crystals and CdHgTe-CdTe Epitaxial Structures

Authors: V.V. Ratnikov, T.S. Argunova, K.E. Mironov, L.M. Sorokin

461

Grazing Incidence Diffraction X-Ray Topography

Authors: R.M. Imamov, D.V. Novikov

467

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