Peculiarities in the Defect Behavior in Heat-Treated Cz-Si with a Low and High Oxygen Content

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Periodical:

Solid State Phenomena (Volumes 32-33)

Edited by:

H.G. Grimmeiss, M. Kittler and H. Richter

Pages:

173-180

DOI:

10.4028/www.scientific.net/SSP.32-33.173

Citation:

V. V. Emtsev et al., "Peculiarities in the Defect Behavior in Heat-Treated Cz-Si with a Low and High Oxygen Content", Solid State Phenomena, Vols. 32-33, pp. 173-180, 1993

Online since:

December 1993

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$35.00

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