Application of Electron Microscopy to Semiconductor Materials Research

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 32-33)

Edited by:

H.G. Grimmeiss, M. Kittler and H. Richter

Pages:

511-522

Citation:

J. Heydenreich "Application of Electron Microscopy to Semiconductor Materials Research", Solid State Phenomena, Vols. 32-33, pp. 511-522, 1993

Online since:

December 1993

Authors:

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.