Defect Engineering in Erbium-Doped Silicon Structure Technology

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Periodical:

Solid State Phenomena (Volumes 32-33)

Edited by:

H.G. Grimmeiss, M. Kittler and H. Richter

Pages:

83-88

DOI:

10.4028/www.scientific.net/SSP.32-33.83

Citation:

N.A. Sobolev et al., "Defect Engineering in Erbium-Doped Silicon Structure Technology", Solid State Phenomena, Vols. 32-33, pp. 83-88, 1993

Online since:

December 1993

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Price:

$35.00

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