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HomeSolid State PhenomenaSolid State Phenomena Vols. 47-48

Solid State Phenomena Vols. 47-48

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.47-48

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Paper Title Page

Cyclotron Resonance in Heavily Doped Silicon Quantum Wells
Authors: W. Gehlhoff, Nikolai T. Bagraev, L.E. Klyachkin
589
TEM Analysis of Structure Modification Induced by Additional Carbon Incorporation in Silicon and Si1-xGex Layers Grown with Molecular Beam Epitaxy
Authors: E. Bugiel, S. Ruvimov, H.J. Osten
595
Measurements of Diffusion Length in Si-SiGe Structures
Authors: O.V. Kononchuk, George A. Rozgonyi, Eugene B. Yakimov
601
Determination of Subgap-Asorption in μc-Si:H Films by CPM
Authors: R. Krankenhagen, M. Schmidt, W. Henrion, Irina Sieber, S. Koynov, S. Grebner, R. Schwarz
607
An Analysis of Residual Strain in Dry Etched Semiconductor Nanostructures
Authors: Y.S. Tang, Clivia M. Sotomayor Torres
613

Showing 71 to 75 of 75 Paper Titles

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