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Vols. 47-48

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Vols. 44-46

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HomeSolid State PhenomenaSolid State Phenomena Vols. 47-48

Solid State Phenomena Vols. 47-48

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.47-48

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Table of Contents

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Paper Title Page

The Relaxation and Diffusion Behaviour of Strained Si_1-xGe_x Layers on Si Substrates at High Temperature under Hydrostatic Pressure

Authors: P. Zaumseil, G.G. Fischer, Ch. Quick, Andrzej Misiuk

517

Critical Points of Strained Si_1-yC_y Layers on Si(001)

Authors: W. Kissinger, Michael Weidner, H.J. Osten, M. Eichler

523

Dislocation-Related Photoluminescence in Graded SiGe Buffer Layers Grown by APCVD

Authors: H.B. Erzgräber, G. Kissinger, G. Morgenstern, T. Morgenstern

529

Elastic Relaxation of Pseudomorphic Strain in Quantum Dots

Authors: B. Dietrich, H. Frankenfeldt, Y.S. Tang, Clivia M. Sotomayor Torres, H.P. Zeindl, A. Wolff

535

Electrical Activity of Misfit Dislocations in GaAsSb/GaAs Heterojunctions

Authors: T. Wosiński, A. Makosa, J. Raczynska

541

Twin Formation during Epitaxial Growth of InP on Si

Authors: H.-H. Wehmann, G.-P. Tang, A. Koch, Michael Seibt, A. Schlachetzki

547

Interface Structure and Dislocation Formation in InGaAs/GaAs SQWs Grown with Different In Content on Vicinal Substrates

Authors: Cesare Frigeri, A. Di Paola, D.M. Ritchie, F. Longo, A. Brinciotti, M. Riva, F. Vidimari

553

Determination of Interface Structure and Bonding by Z-Contrast STEM

Authors: S.J. Pennycook, Nigel D. Browning, M.M. McGibbon, A.J. McGibbon, M.F. Chisholm, D.E. Jesson

561

Tomographic Atom Probe: A New Tool for Nanoscale Characterisation

Authors: M. Leisch

573

PHOTO-EDSR in Plastically Deformed p-Si

Authors: Hermann G. Grimmeiss, P. Omling, A.I. Shalynin

583

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