Raman Spectroscopy Investigation of Silicon Nanocrystals Formation in Silicon Nitride Films

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Periodical:

Solid State Phenomena (Volumes 57-58)

Edited by:

C. Claeys, J. Vanhellemont, H. Richter and M. Kittler

Pages:

501-506

DOI:

10.4028/www.scientific.net/SSP.57-58.501

Citation:

V. A. Volodin et al., "Raman Spectroscopy Investigation of Silicon Nanocrystals Formation in Silicon Nitride Films", Solid State Phenomena, Vols. 57-58, pp. 501-506, 1997

Online since:

July 1997

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Price:

$35.00

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