The Rinsing Problem: Effect of Solute-Surface Interactions on Wafer Purity

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Periodical:

Solid State Phenomena (Volumes 65-66)

Edited by:

Marc Heyns, Marc Meuris and Paul Mertens

Pages:

1-6

DOI:

10.4028/www.scientific.net/SSP.65-66.1

Citation:

L. M. Loewenstein and P. W. Mertens, "The Rinsing Problem: Effect of Solute-Surface Interactions on Wafer Purity", Solid State Phenomena, Vols. 65-66, pp. 1-6, 1999

Online since:

November 1998

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Price:

$35.00

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