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HomeSolid State PhenomenaSolid State Phenomena Vols. 67-68Photoluminescence Measurements of Microcrystalline...

Photoluminescence Measurements of Microcrystalline Silicon

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Abstract:

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Polycrystalline Semiconductors V

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Periodical:

Solid State Phenomena (Volumes 67-68)

Pages:

155-160

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.67-68.155

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Online since:

April 1999

Authors:

M. Meister, Joerg Weber, M. Furtsch, H. Muenzel

Keywords:

Microcrystalline Silicon, Photoluminescence (PL), Refractive Index

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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