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HomeSolid State PhenomenaSolid State Phenomena Vols. 67-68Structure Dependence of the Electrical...

Structure Dependence of the Electrical Conductivity of Hydrogenated Nanocrystalline Silicon Films

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Polycrystalline Semiconductors V

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Periodical:

Solid State Phenomena (Volumes 67-68)

Pages:

143-148

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.67-68.143

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Online since:

April 1999

Authors:

A. Achiq, Richard Rizk, F. Gourbilleau, P. Voivenel, B. Garrido, J.L. Pérez-Rodríguez, J.R. Morante

Keywords:

Crystalline Fraction, Electrical Properties, Hydrogen Plasma Sputtering

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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