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HomeSolid State PhenomenaSolid State Phenomena Vols. 69-70Oriented Silicon Films on Glass Substrates for...

Oriented Silicon Films on Glass Substrates for Device Applications

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Gettering and Defect Engineering in Semiconductor Technology VIII

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Periodical:

Solid State Phenomena (Volumes 69-70)

Pages:

557-562

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.69-70.557

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Online since:

August 1999

Authors:

M.D. Efremov, Vladimir A. Volodin, V.V. Bolotov, A.V. Vishnyakov, O.K. Shabanova, D.I. Bragin, Liudmila I. Fedina, S.A. Kochubei

Keywords:

Conductivity, Nanocrystal, Raman Spectroscopy, Silicon, TFT

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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