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HomeSolid State PhenomenaSolid State Phenomena Vols. 78-79Deep Levels in Bulk-ZnSe Grown by Bridgman Method

Deep Levels in Bulk-ZnSe Grown by Bridgman Method

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Beam Injection Assessment of Microstructures in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 78-79)

Pages:

367-376

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.78-79.367

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Online since:

April 2001

Authors:

M. Yoneta, T. Kubo, K. Ohmori, K. Yoshino, M. Ohishi, H. Saito

Keywords:

Bulk-ZnSe, Deep Level, DLTS

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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