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HomeSolid State PhenomenaSolid State Phenomena Vols. 80-81

Solid State Phenomena Vols. 80-81

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.80-81

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Table of Contents

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Paper Title Page

Correlation between the Ageing and the Grain Size of Polysilicon Thin-Film Transistors

Authors: H. Toutah, B. Tala-Ighil, J.F. Llibre, T. Mohammed-Brahim, Youri Helen, Gaёl Gautier, K. Mourgues, F. Raoult

343

Analysis of Hot Carrier Effect in Low-Temperature Poly-Si Thin-Film Transistors towards High Reliability

Authors: Takashi Fuyuki, Yukiharu Uraoka

349

Low-Temperature Plasma-Processed Microcrystalline Silicon Thin Films for Large-Area Electronics

Authors: Pere Roca i Cabarrocas, Surendra Kumar, V. Tripathi, P. Bulkin, R. Brenot, B. Drévillon, R. Vanderhaghen, I. French

361

Electrical and Noise Characterization of Large-Grain Polycrystalline Silicon Thin-Film Transistors

Authors: F.V. Farmakis, D.M. Tsamados, J. Brini, G. Kamarinos, C.A. Dimitriadis

367

Accumulation Mode in Polycrystalline Silicon Thin-Film Transistors

Authors: Y. Bourezig, H. Sehil, Baya Zebentout, Z. Benamara, F. Raoult, O. Bonnaud

373

Simulation of the Backward Current in Polycrystalline Silicon Thin-Film Transistors

Authors: M. Baudet, H. Lhermite, T. Mohammed-Brahim

379

Addressing of Organic Electroluminescent Displays

Authors: Didier Pribat, F. Plais

385

Low-Pressure Chemical Vapor Deposition of Semi-Insulating Polycrystalline Silicon (SIPOS) and its Analysis: Application to Power Diode Passivation

Authors: E.S. Ferreira, N.I. Morimoto

391

Nanocrystalline Silicon Carbide: Structure, Properties and Application to SiC/Si Heterostructure Devices

Authors: S. Kerdiles, Richard Rizk, D. Grebille, L. Pichon, O. Bonnaud

397

Mechanical Properties of Thin and Thick Polysilicon Films for Microsystem Applications

Authors: J.R. Morante

405

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