Characterization of Nucleation Sites in Nitrogen Doped Czochralski Silicon by Density Functional Theory and Molecular Mechanics

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 95-96)

Edited by:

H. Richter and M. Kittler

Pages:

99-104

DOI:

10.4028/www.scientific.net/SSP.95-96.99

Citation:

F. Sahtout Karoui et al., "Characterization of Nucleation Sites in Nitrogen Doped Czochralski Silicon by Density Functional Theory and Molecular Mechanics", Solid State Phenomena, Vols. 95-96, pp. 99-104, 2004

Online since:

September 2003

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.