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Passivation of Metals and Semiconductors

Materials Science Forum Volumes 185 - 188

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• p119 Effect of Structure of Hydrogenated SiN_x:H Films on the Dissociation Mechanism of Si-H and N-H Bonds   [ 409 K ]
  Authors: E.B. Gorokhov, A.G. Noskov, V.V. Vasilyev, E.M. Trukhan, V.N. Ovsyuk, G.Yu. Salieva
• p129 Stress Generation and Relaxation in Passivating Films and its New Application in Nanolitography   [ 970 K ]
  Authors: E.B. Gorokhov, A.G. Noskov, V.Ya. Prinz
• p145 High Resolution Surface Characterisation Using STM Light Emission Techniques   [ 410 K ]
  Authors: J. Horn, N. Marx, B.L. Weiss, H.L. Hartnagel, M. Stehle, M.M. Bischoff, H. Pagnia
• p155 Passivation of Semiconductors by the Remote Plasma Technique   [ 526 K ]
  Authors: Wilhelm Kulisch, F. Kiel, M. Schiller, S. Reinke, R. Kassing
• p165 AES Study of the GaAs-Germanium Oxynitride Interface   [ 214 K ]
  Authors: D. Jishiashvili, R. Dzhanelidze, Z. Shiolashvili, I. Nakhutsrishvili
• p171 Passivation Studies of Se/GaAs Interface using X-Ray Photoelectron and Photoluminescence Spectroscopy   [ 375 K ]
  Authors: B.A. Kuruvilla, A. Datta, R.S. Kulkarni
• p179 Passivation of GaAs with Sulphur Surface Treatment and UVCVD Silicon Nitride Cap Layer   [ 272 K ]
  Authors: H. Sik, J.L. Courant, B. Sermage
• p185 Silicon Nitride and Oxide Deposited by Direct Photolysis on Sulfur Treated GaAs and InP: Application to III-V Passivation   [ 234 K ]
  Authors: N. Proust, Gérard Guillot, M. Petitjean, M. Beguet, J.F. Chapeaublanc, J. Perrin
• p191 Surface Passivation of III-V Compound Semiconductors with Chalcogen Atoms   [ 540 K ]
  Authors: H. Oigawa, H. Shigekawa, Y. Nannichi
• p199 Passivation of InP for Optoelectronics   [ 463 K ]
  Authors: H. Kräutle
• p209 Formation of Oxide Films on HgCdTe after Fluorine-Consist Rinsing   [ 335 K ]
  Authors: L. Romashko, A. Myasnikov, V.N. Ovsyuk, V. Vasilyev, T. Zemtsova
• p221 STM and AFM Studies of Passive Films   [ 866 K ]
  Authors: Philippe Marcus, Vincent Maurice
• p233 Disorder and Structural Relaxation in Passive Films on Fe-Cr Alloys   [ 510 K ]
  Authors: M.P. Ryan, Shinji Fujimoto, George E. Thompson, R.C. Newman
• p241 Atomic Structure and Mechanical Behaviour of Passive Film Formed on Stainless Steels   [ 825 K ]
  Authors: J.M. Olive, Vincent Vignal, D. Desjardins
• p251 AFM Observations of the Breakdown Damage in Anodic T₂O₅ Films   [ 642 K ]
  Authors: I. Montero, J.M. Albella, L. Vázquez