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Beam Injection Assessment of Defects in Semiconductors

Solid State Phenomena Volumes 63 - 64

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• p257 Near-Field Cathodoluminescence (NF-CL) Investigations on Semiconducting Materials   [ 252 K ]
  Authors: V. Ebinghaus, R.M. Cramer, R. Heiderhoff, L.J. Balk
• p261 Local Stress, Surface Reconstruction, and Bulk Defect Nucleation: An STM Study on Silicon   [ 813 K ]
  Authors: Hans Joachim Müssig, Jaroslaw Dąbrowski
• p273 Correlative SEM/STM Study of Local Electronic Properties in Compound Semiconductors   [ 797 K ]
  Authors: J. Piqueras, G.N. Panin, C. Díaz-Guerra, P. Hidalgo, B. Méndez
• p283 Observation and Modelization of the Electrostatic Force due to the Local Variations of the Surface Potential by Electrostatic Force Microscopy (EFM)   [ 222 K ]
  Authors: J.F. Bresse
• p291 The Sloc Positron Beam Technique – A Unique Tool for the Study of Vacancy-Type Defects in Semiconductors   [ 581 K ]
  Authors: Reinhard Krause-Rehberg, S. Eichler, J. Gebauer, F. Börner
• p301 Minority Carrier Transient Spectroscopy of Copper-Silicide and Nickel-Disilicide Precipitates in Silicon   [ 493 K ]
  Authors: O.F. Vyvenko
• p311 Grain Growth of ZnSe Recrystallized in the Solid Phase   [ 347 K ]
  Authors: S. Fusil, A. Zozime, R. Pénelle, F. Grillon, C. Le Paven, Andre Rivière, R. Triboulet
• p317 Lateral Doping Inhomogeneities as Revealed by μ-NEXAFS and μ-PES   [ 507 K ]
  Authors: R.P. Mikalo, P. Hoffmann, Th. Heller, D. Schmeißer
• p327 Application of Surface Electron Beam Induced Voltage Method for the Contactless Characterization of Semiconductor Structures   [ 387 K ]
  Authors: E.I. Rau, A.N. Zhukov, Eugene B. Yakimov
• p333 Modification of Electronical and Optical Properties in SiO₂ Films by Electron Beam Irradiation   [ 326 K ]
  Authors: Hans Joachim Fitting, A. von Czarnowski, A.N. Trukhin, M. Goldberg, T. Barfels
• p341 Fabrication and Ellipsometric Investigation of Thin Films of Rare-Earth Oxides   [ 272 K ]
  Authors: O.V. Fursenko, T.V. Semikina, A.N. Shmyrjeva
• p347 Non-Destructive Investigations of Co and CoSi_2-x Films on Si Substrate   [ 233 K ]
  Authors: N.L. Dmitruk, O.V. Fursenko, Arthur Medvid, D. Knight, A. Grigonis
• p353 Characterization of Laser-Irradiated Cd_xHg_1-xTe Solid Solutions by Scanning Microscopy Method   [ 487 K ]
  Authors: V.A. Gnatyuk
• p361 Scanning Acoustic Microscopes for the Investigation of Ferroelectric Properties of Materials   [ 602 K ]
  Authors: Xing Gang Liu, L.J. Balk, G. Shafirstein, A. Eckau, Qing Rui Yin
• p369 The Nature of the Electronic States of Cu₃Si-Precipitates in Silicon   [ 338 K ]
  Authors: Andreas Sattler, Henrik Hedemann, Andrei A. Istratov, Michael Seibt, Wolfgang Schröter