ZnO Films and Crystals on Bulk Silicon and SOI Wafers: Formation, Properties and Applications

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In present work the investigation of the electrochemical and chemical hydrothermal deposition processes of ZnO on silicon is presented. The influence of the electrochemical process parameters on the characteristics and morphology of the ZnO deposits is analyzed. Electrochemical deposition from non aqueous DMSO solutions on porous silicon buffer layer is also discussed. The details of the chemical hydrothermal deposition from the nitrate bath of high-quality ZnO crystals on silicon substrate are presented. It was shown that morphology and size of synthesized ZnO crystals depends on the temperature of the deposition bath. Differences between photoluminescence of electrochemically deposited ZnO thin films and hydrothermally synthesized crystals are shown. Electrochemically deposited ZnO films demonstrate defect-caused luminescence and hydrothermally grown ZnO crystals shows intensive exciton luminescence band in UV region. Hydrothermal deposition of high-quality ZnO crystals on the surface of electrochemically deposited ZnO seed layer with porous silicon buffer improves photoluminescence properties of the structure which is useful for optoelectronics applications. Possible applications of ZnO as gas sensors and photovoltaic devices are considered. Aspects of ZnO electrochemical deposition on bulk silicon and silicon-on-isolator wafers for integration purposes are discussed.

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3-19

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July 2011

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] U. Ozgur, Ya.I. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Doğan, V. Avrutin, S. -J. Cho and H. Morkoç: J. Appl. Phys. Vol. 98 (2005), p.041301.

DOI: 10.1063/1.1992666

Google Scholar

[2] Z.L. Wang: Materials Today Vol. 7 (2004), p.26.

Google Scholar

[3] D.C. Look, D.C. Reynolds, J.W. Hemsky, R.L. Jones and J.R. Sizelove: Appl. Phys. Lett. Vol. 75 (1999), p.811.

Google Scholar

[4] H. Ohta and H. Hosono: Materials Today Vol. 7 (2004), p.42.

Google Scholar

[5] J. Cembrero and D. Busquets-Mataix: Thin Solid Films Vol. 517 (2009), p.2859.

DOI: 10.1016/j.tsf.2008.10.069

Google Scholar

[6] D. Lincot: Thin Solid Films Vol. 487 (2005), p.40.

Google Scholar

[7] S. Baruah and J. Dutta: Sci. Technol. Adv. Mater. Vol. 10 (2009), p.013001.

Google Scholar

[8] S. Hasegawa, K. Maehashi, H. Nakashima, T. Ito and A. Hiraki: J. Cryst. Growth Vol. 95 (1989), p.113.

Google Scholar

[9] V. Levchenko, L. Postnova, V. Bondarenko, N. Vorozov, V. Yakovtseva and L. Dolgyi: Thin Solid Films Vol. 348 (1999), p.141.

DOI: 10.1016/s0040-6090(99)00052-8

Google Scholar

[10] V. Yakovtseva, N. Vorozov, L. Dolgyi, V. Levchenko, L. Postnova, M. Balucani, V. Bondarenko, G. Lamedica, E. Ferrara and A. Ferrari: Phys. Status Solidi Vol. A 182 (2000), p.195.

DOI: 10.1002/1521-396x(200011)182:1<195::aid-pssa195>3.0.co;2-g

Google Scholar

[11] E.B. Chubenko, A.A. Klyshko, V.A. Petrovich and V.P. Bondarenko: Thin Solid Films Vol. 517 (2009), p.5981.

DOI: 10.1016/j.tsf.2009.03.134

Google Scholar

[12] V. Raiko, R. Spitzl, J. Engermann, V. Borisenko and V. Bondarenko: Diamond Relat. Mater. Vol. 5 (1996), p.1063.

Google Scholar

[13] E. Chubenko, V.P. Bondarenko and M. Balucani: Tech. Phys. Lett. Vol. B 60 (2009), p.3320.

Google Scholar

[14] S. Baruah and J. Dutta : J. Crystal Growth Vol. 311 (2009), p.2549.

Google Scholar

[15] M.N.R. Ashfold, R.P. Doherty, N.G. Ndifor-Angwafor, D.J. Riley and Y. Sun: Thin Solid Films Vol. 515 (2007), p.8679.

DOI: 10.1016/j.tsf.2007.03.122

Google Scholar

[16] Ch. Liu, Y. Masud, Y. Wu and O. Takai: Thin Solid Films Vol. 503 (2006), p.110.

Google Scholar

[17] T. Yoshida, D. Komatsu, N. Shimokawa and H. Minoura: Thin Solid Films Vol. 451/452 (2004), p.166.

DOI: 10.1016/j.tsf.2003.10.097

Google Scholar

[18] K. -H. Li, C. Tsai, S. Shih, T. Hsu, D.L. Kwong and J.C. Campbell: J. Appl. Phys. Vol. 72 (1992), p.2816.

Google Scholar

[19] D. Gal, G. Hodesa, D. Lincot and H. -W. Schock: Thin Solid Films Vol. 361/362 (2000), p.79.

Google Scholar

[20] W.C. Zhang, X.L. Wu, H.T. Chen, J. Zhu and G.S. Huang: J. Appl. Phys. Vol. 103 (2008), p.3718.

Google Scholar

[21] C. Mo, Y. Li, Y. Liu, Y. Zhang and L. Zhang: J. Appl. Phys. Vol. 83 (1998), p.4389.

Google Scholar

[22] J. Albertsson, S.C. Abrahams and A. Kvick: Acta Crystallogr., Sect. B: Struct. Sci. Vol. 45 (1989), p.34.

Google Scholar

[23] Y. Okada and Y. Tokumaru: J. Appl. Phys. Vol. 56 (1984), p.314.

Google Scholar

[24] S. Basu and P.K. Basu: Journal of Sensors Vol. 2009 (2009), p.861968.

Google Scholar

[25] Z.L. Wang: Adv. Funct. Mat. Vol. 18 (2008), p.3553.

Google Scholar