Population Dynamics of Excitons in Silicon Nanocrystals Structures under Strong Optical Excitation

Abstract:

Article Preview

We report on the experimental and theoretical studies of population/depopulation dynamics of excitons in the structures with Si nanocrystals in SiO2 matrix (nc-Si/SiO2) under strong optical excitation. The experimental results are explained using a phenomenological model based on rate equations for coupled system of energy donors (excitons) and energy acceptors (erbium ions). Exciton luminescence is found to exhibit superlinear dependence for Er-doped samples. At the same time the Er-related luminescence at 1.5 μm shows a saturation of the intensity and shortening of the lifetime, which are attributed to the population inversion of the Er ions states. The obtained results demonstrate that nc-Si/SiO2:Er systems can be used for applications in Si-based optical amplifiers and lasers, compatible with planar Si-technology.

Info:

Periodical:

Edited by:

S. J. CHUA, J. H. TENG, O. WADA, R. DE LA RUE and X. H. TANG

Pages:

196-198

Citation:

O. A. Shalygina et al., "Population Dynamics of Excitons in Silicon Nanocrystals Structures under Strong Optical Excitation", Advanced Materials Research, Vol. 31, pp. 196-198, 2008

Online since:

November 2007

Export:

Price:

$38.00

[1] Sh. Takeoka, M. Fujii, Sh. Hayashi. Phys. Rev. B. Vol. 62 (2000), pp.16820-25.

[2] G. Franzo, V. Vinciguerra, F. Priolo. Appl. Phys. A. Vol. 69 (1999), pp.3-12.

[3] M. Fujii, M. Yoshida, Y. Kanzava, S. Hayashi, K. Yamamoto. Appl. Phys. Lett. Vol. 71 (1997), p.1198.

[4] M. Zacharias, J. Heitmann, R. Shcholz, U. Kahler, M. Schmidt, J. Bläsing. Appl. Phys. Lett. Vol. 80 (2002), p.661.

[5] V. Yu. Timoshenko, M. G. Lisachenko, O. A. Shalygina, B. V. Kamenev, D. M. Zhigunov, S. A. Teterukov, P. K. Kashkarov, J. Heitmann, M. Zacharias. J. Appl. Phys. Vol. 96 (2004), p.2254.

DOI: https://doi.org/10.1063/1.1773383

[6] D. Kovalev, H. Heckler, G. Polisski, F. Koch. Phys. Stat. Sol. (b). Vol. 215 (1999), p.871.

Fetching data from Crossref.
This may take some time to load.