Zinc Oxide Buffer Layer Insertion for Sensitivity Improvement in Aluminium-Doped Zinc Oxide-Based Humidity Sensors

Abstract:

The improvement of sensitivity toward humidity by insertion of buffer layer has been investigated. The insertion of hetero- or homo-buffer layer of zinc oxide (ZnO) thin film before deposition of high quality ZnO had been reported for the growth on highly mismatched substrate. Three samples are characterized with different properties which are as deposited ZnO thin film without buffer layer (as deposited ZnO thin film) , anneal ZnO thin film without buffer layer (ZnO thin film) and anneal ZnO thin film with buffer layer (ZnO/ AZO thin film). The structural properties of ZnO thin film has been characterized field emission scanning electron microscopy (FESEM) JEOL JSM 6701F, atomic force microscope AFM (Park System XE-100) and XRD (Rigaku Ultima IV). The electrical and optical properties has been characterized using 2 point probe I-V measurement (Keithley 2400) and UV-Vis spectrophotometer (JASCO 670) respectively. In this work, we have focused on investigating the humidity sensitivity of ZnO thin film deposited using RF magnetron sputtering (SNTEK RSP 5004-PVD) with and without the buffer layer (Aluminum-doped ZnO (AZO)) for humidity sensor application.

• Periodical: Advanced Materials Research (Volume 667)
• Pages: 287-293
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.667.287
• Online since: March 2013
• Authors: Nor Diyana Md Sin, Mohamed Zahidi Musa, Mohamad Hafiz Mamat, S. Ahmad, A. Abdul Aziz, Mohamad Rusop Mahmood
• Keywords: Epitaxy, FESEM, Humidity Sensitivity, RF Magnetron Sputtering, ZnO Buffer Layer

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