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Paper Title Page
Abstract: Your 32nm is different from my 32nm! The paradoxical statement reflects one of the most
essential debates in the field of nanoscale dimension metrology for process control in the modern
nanoelectronic manufacturing industry. This baffling debate is all about accuracy and traceability of
dimension measurement systems used on production floors. As the circuit geometry and density
continues to scale to the 45nm node and below, the metrology bias and uncertainty play a more
significant role, and the characterization becomes more difficult. This article assesses the capability of
atomic force microscope (AFM) as an accurate inline calibration metrology tool and the correlation of
AFM measurement to NIST traceable standards. It introduces the methodology of adopting AFM as a
traceable reference tool for CD SEM and optical scatterometry used in inline process control. The
focus is on height, linewidth, and pitch calibrations due to their critical but challenging roles for
process control in today’s nanoelectronic manufacturing. Care must be taken to minimize the impact
from factors that affect the traceability and accuracy in the AFM system, including tip width
calibration, tip wear, tip shape effect, contamination, and linewidth roughness.
549
Abstract: To ensure the reliability of the measurement results with optical digitizers, it is necessary
that the instruments are verified under proper protocols with traceably calibrated artefacts. The
requirement for test artefacts is being calibrated with small uncertainty. In addition, it is needed that
the optical characteristics of the artefacts' surface are suitable for the measurement with optical
sensors because optical digitizers adopt different measuring methods. In this research, the concept,
structure and feature of the test artefacts are reported.
553
Abstract: In this paper a Kalman filter algorithm for estimating a linear regression model wıth
account of the regression vector error is presented. That approach has been applied to calibrating
measuring instruments and gives a rigorous derivation of a recurrent algorithm for estimating the
parameters of the calibration curve with the incorporation of the errors in reproducing the inputs.
Calibration of the differential pressure gauge by the standard pressure setting devices (piston
gauges) is demonstrated in the paper as an example.
557
Abstract: The next generation GPS standard system is based on operation/operator. One of the most
important motivations of the next generation GPS is to reduce specification uncertainty. This paper
analyzes the origination of specification uncertainty and the relationship between specification
uncertainty and other two important uncertainties in the next generation GPS, correlation uncertainty
and measurement. And then the procedure for management of Specification uncertainty is proposed
in the paper. Finally, a method on evaluation of specification uncertainty and the general formula for
this method is proposed. The embodied formula for estimation of specification uncertainty on the
diameter example is deduced in the paper.
561
Abstract: The today’s nanometrology limits the accuracy of the precision engineering. These limits
are based on the meter definition as redefined in 1983. It is proposed to define precision mechatronics
as the science and engineering of high level precision systems and machines. The paper describes a
precision mechatronic machine. This device represents a long range positioning machine having a
resolution of 0.1 nm over the range of 25 mm x 25 mm x 5 mm. The integration of several optical and
tactile nanoprobes makes the 3D-nanopositioning suitable for various tasks. New developed
nanoprobes (optical focus probe, nanoindenter, metrological scanning force microscope) and results
of measurement will be presented.
565
Abstract: This paper presents a scanning squareness measurement method for large ultra-precision
components. A rectangular block as the squareness reference is used. The squareness error of the
rectangular block is eliminated according to the geometric principle that the sum of four internal
angles of a rectangle is 360°. And the straightness error of each line of the rectangular block is
eliminated by means of scanning method with two 1D probes. The above two error separation
technologies are combined effectively and the data processing method is developed. Additionally, the
standard uncertainties including tilt and squareness errors of the rectangular block, temperature drift
and random errors of the measured values of the probes are analyzed theoretically. It is confirmed that
a combined standard uncertainty of less than 1 arcsec can be obtained for typical values of the
parameters.
569
Abstract: Vertical metro-scopes using Abbe’s principle AVM are used for different dimensional
measurements. The accuracy of their measurement is low compared to other available techniques
used in the calibration of gauge blocks. This uncertainty can be improved through the use of laser
interferometer system in combination with it. This paper describes the improvement, the results of
the calibration of a set of gauge blocks and the uncertainty budget for such a calibration. The
uncertainty of such calibration is estimated to be within ± (0.06+L/650) *m; L in mm; for gauge
blocks less than 200 mm. An inter-comparison between the results of such improved AVM and the
results obtained from one of the gauge block electronic comparators available on the market proved
that the differences in the mean results are insignificant.
573
Abstract: Tooth flank form deviation of micrometers influences vibration and noise characteristics of
gears and therefore strict quality control of tooth flank form is demanded. However, since gear
checker is structurally-complex, it is difficult to analyze how error factors of gear checkers influence
the measurement result. In this research, Virtual Gear Checker (VGC) is proposed, which is a
simulation program of gear measurement considering the mechanisms and motions of gear checkers
and possible error factors. The influence of the error factors on the measurement result can be clarified
by VGC. VGC is also able to calculate the theoretical measurement result of non-involute helicoid
artifact. It is easy for VGC to measure tooth flank form repeatedly in virtual space and therefore it can
assess the uncertainty of measurement with gear checker. The uncertainty of gear measurement is
calculated as an example.
577
Abstract: A technique to compensate the geometry errors of industrial robot using Laser Tracker
System (LTS) has been presented in this paper. A Spherically Mounted Retro-reflector (SMR) is
mounted on the end-effector of industrial robot. The positions of SMR are measured by LTS and
compared with the nominal value of industrial robot to get geometry error database of robot. The
updated error database, together with real-time measuring of the positions on the robot’s end-effector
can be used to compensate the geometric errors of the robot. Using this technique to compensate the
industrial robot, the geometry errors can be decreased from 0.1mm to 0.04mm.
579
Abstract: In current application of measurement uncertainty evaluation, dynamic uncertainty
evaluation simply uses the static uncertainty methods. To change the situation, a new evaluation
method of measurement uncertainty is investigated based on Bayesian principle in this paper.
Bayesian evaluation method uses conjugate normal-inverted gamma distribution as the distribution
function in uncertainty evaluation, which can be employed to evaluate both static and dynamic
measurement uncertainty. The evaluation method put forward in this paper can achieve higher
evaluation accuracy than the conventional methods, particularly in processing dynamic data with
small samples. It has been proved in theory and by computer simulation.
583