Measurement Technology and Intelligent Instruments VIII

Volumes 381-382

doi: 10.4028/

Paper Title Page

Authors: Kai Hu, Xiang Qian Jiang, Xiao Jun Liu

Abstract: A new signal-denoising approach based on DT-CWT (Dual-Tree Complex Wavelet Transform) is presented in this paper to extract feature...

Authors: Kengo Fujimaki, Kimiyuki Mitsui

Abstract: The optical measuring device developed in this study is based on laser autocollimation and can measure the radial error motions of a...

Authors: F. Zhang, Xing Hua Qu, J.F. Dai, S. Ye

Abstract: The computer aided measuring system is established to evaluate geometrical information of the structure in subsection manufacture. The...

Authors: Jian Jun Ding, Zhuang De Jiang, Bing Li, Jun Jie Guo

Abstract: The detection technique of small module gears has a very important research and application value. In this paper, a composite measuring...

Authors: Zhi Jing Yu, X. Li, X. Si, J. Zhu, D. He, Q. Gao

Abstract: A fully automatic and rather flexible mobile vision 3D coordinate online measurement system is presented and analyzed. The system is...

Authors: X. Ding, Zhi Min Zhao, Y. Chen, Y. Hou

Abstract: Interferometry is a meterage technology which is based on light-wave interference theory. In the general interferometry measurements, the...

Authors: Sonko Osawa, Osamu Sato, Toshiyuki Takatsuji

Abstract: Reversal and multiple measurement techniques have been used in dimensional metrology [1]. The reversal technique in straightness...

Authors: Masaharu Komori, Sonko Osawa, Osamu Sato, T. Kiten, D. Shirasaki, Toshiyuki Takatsuji

Abstract: In this research, a novel high-precision pitch artifact using balls is proposed for calibration of pitch measuring instruments. This pitch...

Authors: Shyh Tsong Lin, T.L. Lin

Abstract: This paper introduces a dual-path Mach-Zehnder interferometer for determining refractive index and geometrical thickness of an optical...

Authors: Xing Fu, L. Li, Y. Wu, N. Geng

Abstract: Experiments are carried out on a femtosecond laser micromachining system with the wavelength 775nm. The ablated patterns on Si (100) and Si...


Showing 21 to 30 of 167 Paper Titles