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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263ODMR Investigations of Ge Acceptors in p-Type...

ODMR Investigations of Ge Acceptors in p-Type Al_0.4Ga_0.6As

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

1315-1320

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.1315

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Online since:

December 1997

Authors:

M.V.B. Pinheiro, K. Krambrock, A.S. Chaves, K.H. Wietzke, F.K. Koschnick, Johann Martin Spaeth

Keywords:

Acceptor, Al_xGa_1-xAs, Ge, ODMR, Persistent Photoconductivity

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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