Defect Characterization of II-VI Compound Semiconductors Using Positron Lifetime Spectroscopy

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Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

1335-1340

DOI:

10.4028/www.scientific.net/MSF.258-263.1335

Citation:

G. Tessaro and P. Mascher, "Defect Characterization of II-VI Compound Semiconductors Using Positron Lifetime Spectroscopy", Materials Science Forum, Vols. 258-263, pp. 1335-1340, 1997

Online since:

December 1997

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$35.00

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