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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Segregation of Gold at Dislocations Confirmed by...

Segregation of Gold at Dislocations Confirmed by Gold Diffusion into Highly Dislocated Silicon

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

1783-1788

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.1783

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Online since:

December 1997

Authors:

Hartmut Bracht, A. Rodriguez Schachtrup, Ichiro Yonenaga

Keywords:

Dislocation, Gold, Neutron Activation Analysis, Segregation, Silicon

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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