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HomeMaterials Science ForumMaterials Science Forum Vols. 264-268Growth and Characterization of Thin Films and...

Growth and Characterization of Thin Films and Patterned Substrates of III-V Nitrides on SiC (0001) Substrates

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Silicon Carbide, III-Nitrides and Related Materials

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Periodical:

Materials Science Forum (Volumes 264-268)

Pages:

1111-1114

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.264-268.1111

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Online since:

February 1998

Authors:

Robert F. Davis, M.D. Bremser, O.H. Nam, T.S. Zheleva, W.G. Perry, B.L. Ward, Robert J. Nemanich

Keywords:

Cathodoluminescence, Field Emission, III-Nitride Alloys, Lateral Epitaxy, Metalorganic Vapor Phase Epitaxy, Selective Growth

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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