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HomeMaterials Science ForumMaterials Science Forum Vols. 264-268The Atomic Structure of Prismatic Planar Defects...

The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates

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Periodical:

Materials Science Forum (Volumes 264-268)

Pages:

1247-1250

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.264-268.1247

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Online since:

February 1998

Authors:

Gerard Nouet, Philippe Vermaut, V. Potin, Piere Ruterana, A. Salvador, Hadis Morkoç

Keywords:

Convergent Beam Electron Diffraction (CBED), High Resolution Electron Micrograph, Inversion Domains, Stacking Fault

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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