Structural Characterisation of GaN Layers on Sapphire Grown by MOCVD

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

1255-1258

Citation:

B. Pécz et al., "Structural Characterisation of GaN Layers on Sapphire Grown by MOCVD", Materials Science Forum, Vols. 264-268, pp. 1255-1258, 1998

Online since:

February 1998

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