High Resolution Photoemission Spectroscopy Using Synchrotron Radiation Study of the SiO2/β-SiC(100)3x2 Interface Composition

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

391-394

DOI:

10.4028/www.scientific.net/MSF.264-268.391

Citation:

D. Dunham et al., "High Resolution Photoemission Spectroscopy Using Synchrotron Radiation Study of the SiO2/β-SiC(100)3x2 Interface Composition", Materials Science Forum, Vols. 264-268, pp. 391-394, 1998

Online since:

February 1998

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$35.00

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