Transmission Electron Microscopy Investigation of Defects in B-Implanted 6H-SiC

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

413-416

DOI:

10.4028/www.scientific.net/MSF.264-268.413

Citation:

P.O.Å. Persson et al., "Transmission Electron Microscopy Investigation of Defects in B-Implanted 6H-SiC", Materials Science Forum, Vols. 264-268, pp. 413-416, 1998

Online since:

February 1998

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$35.00

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