Monitory Carrier Lifetime Measurements in 6H-SiC Using the Photoconductive Decay Technique

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

525-528

DOI:

10.4028/www.scientific.net/MSF.264-268.525

Online since:

February 1998

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Price:

$35.00

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