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HomeMaterials Science ForumMaterials Science Forum Vols. 264-268Physical and Electrical Characterization of WN...

Physical and Electrical Characterization of WN Schottky Contacts on 4H-SiC

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Periodical:

Materials Science Forum (Volumes 264-268)

Pages:

817-820

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.264-268.817

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Online since:

February 1998

Authors:

Olivier Noblanc, C. Arnodof, S. Cassette, Christian Brylinski, A. Kakanakova-Georgieva, Ts. Marinova, Liliana Kassamakova, R. Kabanakov, Béla Pécz, A. Sulyok, György Z. Radnóczi

Keywords:

Schottky Rectifiers, TEM, WN, X-Ray Photoelectron Spectroscopy (XPS)

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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