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HomeMaterials Science ForumMaterials Science Forum Vols. 287-288Surface and Thin Film Analysis with Electron and...

Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques

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Trends and New Applications of Thin Films

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Periodical:

Materials Science Forum (Volumes 287-288)

Pages:

61-86

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.287-288.61

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Online since:

August 1998

Authors:

A. Wucher

Keywords:

Analysis, Electron Spectroscopy, Mass Spectroscopy

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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