Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques

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Periodical:

Materials Science Forum (Volumes 287-288)

Edited by:

Horst Hoffmann

Pages:

61-86

DOI:

10.4028/www.scientific.net/MSF.287-288.61

Citation:

A. Wucher "Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques", Materials Science Forum, Vols. 287-288, pp. 61-86, 1998

Online since:

August 1998

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$35.00

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