A Closed-form Analytical Solution of 6H-SiC Punch-through Junction Breakdown Voltages

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Periodical:

Materials Science Forum (Volumes 338-342)

Edited by:

Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer

Pages:

1359-1362

DOI:

10.4028/www.scientific.net/MSF.338-342.1359

Citation:

J. Wang et al., "A Closed-form Analytical Solution of 6H-SiC Punch-through Junction Breakdown Voltages", Materials Science Forum, Vols. 338-342, pp. 1359-1362, 2000

Online since:

May 2000

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$35.00

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