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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342Origin of the Internal Stress Around the Micropipe...

Origin of the Internal Stress Around the Micropipe of 6H-SiC Single Crystal

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

449-452

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.449

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Online since:

May 2000

Authors:

Tomohisa Kato, Hitoshi Ohsato, Takashi Okuda

Keywords:

Defect, Interference, Internal Stress, Micropipe, Photoelasticity

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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