Synchrotron White Beam X-ray Topography and Atomic Force Microscopy Studies of a 540R-SiC Lely Platelet

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 338-342)

Edited by:

Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer

Pages:

469-472

DOI:

10.4028/www.scientific.net/MSF.338-342.469

Citation:

W. M. Vetter et al., "Synchrotron White Beam X-ray Topography and Atomic Force Microscopy Studies of a 540R-SiC Lely Platelet", Materials Science Forum, Vols. 338-342, pp. 469-472, 2000

Online since:

May 2000

Export:

Price:

$35.00

In order to see related information, you need to Login.